Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption

Resource Information

The work Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption represents a distinct intellectual or artistic creation found in Indiana State Library. This resource is a combination of several types including: Work, Language Material, Books.

Label

Database for and statistical analysis of the interlaboratory determination of the conversion coefficient for the measurement of the interstitial oxygen content of silicon by infrared absorption

Statement of responsibility

Aslan Baghdadi, Robert I. Scace, and E. Jane Walters, editors

Contributor

• Scace, Robert I
• Walters, E. Jane
• National Institute of Standards and Technology (U.S.)
• Baghdadi, A

Subject

• Infrared spectroscopy -- Databases
• Infrared spectroscopy -- Statistical methods
• Oxygen -- Measurement -- Databases
• Oxygen -- Measurement | Statistical methods
• Silicon -- Measurement -- Databases
• Silicon -- Measurement | Statistical methods

Genre

• Databases

Language

eng

Member of

• Semiconductor measurement technology
• NIST special publication, 400-82
• NIST special publication, Semiconductor measurement technology

Government publication

federal national government publication

Illustrations

illustrations

Index

no index present

Literary form

non fiction

Nature of contents

• bibliography
• statistics

Series statement

• NIST special publication
• Semiconductor measurement technology
• NIST special publication
• Semiconductor measurement technology

Series volume

• 400-82
• 400-82.