Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide
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The work Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide represents a distinct intellectual or artistic creation found in Indiana State Library. This resource is a combination of several types including: Work, Language Material, Books.
The Resource
Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide
Resource Information
The work Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide represents a distinct intellectual or artistic creation found in Indiana State Library. This resource is a combination of several types including: Work, Language Material, Books.
- Label
- Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide
- Statement of responsibility
- Y. Harada, N. Kurata, G. Furuno
- Language
- eng
- Cataloging source
- GPO
- Government publication
- federal national government publication
- Index
- no index present
- Literary form
- non fiction
- Series statement
- NASA technical translation
- Series volume
- NASA TT-20332
Context
Context of Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxideWork of
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/resource/YCKZRbkyGkY/" typeof="CreativeWork http://bibfra.me/vocab/lite/Work"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/resource/YCKZRbkyGkY/">Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
