United States, Defense Advanced Research Projects Agency
Resource Information
The organization United States, Defense Advanced Research Projects Agency represents an institution, an association, or corporate body that is associated with resources found in Indiana State Library.
The Resource
United States, Defense Advanced Research Projects Agency
Resource Information
The organization United States, Defense Advanced Research Projects Agency represents an institution, an association, or corporate body that is associated with resources found in Indiana State Library.
- Label
- United States, Defense Advanced Research Projects Agency
- Authority link
- (EG-IN)988893
- Subordinate unit
- Defense Advanced Research Projects Agency
73 Items by the Organization United States, Defense Advanced Research Projects Agency
15 Items that are about the Organization United States, Defense Advanced Research Projects Agency
Context
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- A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements
- A laser scanner for semiconductor devices
- A method for evaluating advanced systems and concepts for ground combat : prepared for the Defense Advanced Research Projects Agency
- A wafer chuck for use between -196 and 350CÌŠ
- ARPA/NBS Workshop V, moisture measurement technology for hermetic semiconductor devices : proceedings of the ARPA/NBS Workshop V, held at the National Bureau of Standards, Gaithersburg, MD, March 22-23, 1978
- ARPA/NBS workshop III : test patterns for integrated circuits
- ARPA/NBS workshop IV : surface analysis for silicon devices
- Accurate linewidth measurements on integrated-circuit photomasks
- Angular sensitivity of controlled implanted doping profiles
- Approximate methods for calculating the properties of heated laminar boundary layers in water
- Author training course
- Automated photomask inspection
- Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics
- Ceramic bearing technology : proceedings of the NIST/DARPA Workshop on Ceramic Bearing Technology, April 17-18, 1991, Gaithersburg, Maryland
- Comprehensive test pattern and approach for characterizing SOS technology
- Computer assisted instruction in Air Force medical training : preliminary findings : interim report for period February 1974 - March 1976
- Computerized collective training for teams : final report
- Crop yields and climate change to the year 2000
- DISTRIB I : an impurity redistribution computer program
- Defects in PN junctions and MOS capacitors observed using thermally simulated current and capacitance measurements--video script
- Defense Advanced Research Projects Agency : technology transition
- Defense manpower policy : presentations from the 1976 Rand Conference on Defense Manpower
- Design considerations for computer-based interactive map display systems
- EP-2, an exemplary programming system
- Economic recovery following disaster : a selected, annotated bibliography : a report prepared for Defense Advanced Research Projects Agency
- Environmental assessment : DARPA Grand Challenge
- First-term reenlistment intentions of avionics technicians: a quantitative analysis
- Geologic evaluation of waste-storage potential in selected segments of the Mesozoic aquifer system below the zone of fresh water, Atlantic Coastal Plain, North Carolina through New Jersey
- Hardware-assisted multiprocessor performance measurements
- Human processing of knowledge from texts : acquisition, integration and reasoning
- ISIS and META projects : progress report
- Interactions between tactics and technology in ground warfare : prepared for the Defense Advanced Research Projects Agency
- Interlaboratory study on linewidth measurements for antireflective chromium photomasks
- JTEC panel on display technologies in Japan : final report
- Laser scanning of active semiconductor devices--videotape script
- Lightweight causal and atomic group multicast
- MTP : an atomic multicast transport protocol
- Making real-time reactive systems reliable
- Microelectronic processing laboratory at NBS
- Microelectronic test pattern NBS-3 for evaluating the resistivity-dopaut density relationship of silicon
- Microelectronic test pattern NBS-4
- Moving DARPA technologies into the marketplace
- Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques
- Optical materials characterization : final technical report, February 1, 1978-September 30, 1978
- Performance measurement instrumentation for multiprocessor computers
- Phase-difference processing incorporating time-alignment and time-compression techniques
- Planar test structures for characterizing impurities in silicon
- Programming with process groups : group and multicast semantics
- Results of the Monte Carlo calculation of one- and two-dimensional distributions of particles and damage : ion implanted dopants in silicon
- Safe operation of capacitance meters using high applied-bias voltage
- Semiconductor measurement technology : notes on SEM examination of microelectronic devices
- Semiconductor measurement technology : some aspects of dose measurement for accurate ion implantation
- Semiconductor measurement technology : suppression of premature dielectric breakdown for high-voltage capacitance measurements
- Semiconductor measurement technology : techniques for measuring the integrity of passivation overcoats on integrated circuits
- Semiconductor measurement technology, Progress report
- Sound propagation in the sea
- Specialty training and the performance of first-term enlisted personnel : a report prepared for Defense Advanced Research Projects Agency
- Spreading resistance analysis for silicon layers with nonuniform resistivity
- Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)
- The CRT text editor NED : introduction and reference manual
- The Cross and Laporte kidnappings, Montreal, October 1970 : a report prepared for Department of State and Defense Advanced Research Projects Agency
- The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon
- The Terrain Intervisibility and Movement Evaluation Routine (TIMER) model : a report
- The browse file of NASA/JPL quick look radar images from the Loch Linnhe 1989 experiment
- The capabilities and limitations of auger sputter profiling for studies of semiconductors
- The combined effects of pressure gradient and heating on the stability and transition of boundary layers in water
- The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
- The first Text REtrieval Conference (TREC-1)
- The process group approach to reliable distributed computing
- The use of microcomputers to improve Army ground vehicle readiness : a report prepared for Defense Advanced Research Projects Agency
- The world grain economy and climate change to the year 2000 : implications for policy : report on the final phase of a climate impact assessment
- Tools for distributed application management
- Using process groups to implement failure detection in asynchronous environments
- Veteran status and civilian earnings : a report : prepared for Defense Advanced Research Projects Agency
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/resource/OyL2FrX5ZIs/" typeof="Organization http://bibfra.me/vocab/lite/Organization"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/resource/OyL2FrX5ZIs/">United States, Defense Advanced Research Projects Agency</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
