Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. Johnson
Resource Information
The instance Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. Johnson represents a material embodiment of a distinct intellectual or artistic creation found in Indiana State Library. This resource is a combination of several types including: Instance, Microform.
The Resource
Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. Johnson
Resource Information
The instance Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. Johnson represents a material embodiment of a distinct intellectual or artistic creation found in Indiana State Library. This resource is a combination of several types including: Instance, Microform.
- Label
- Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. Johnson
- Statement of responsibility
- prepared by L.M. Kaufman, B.W. Johnson
- Note
-
- "University of Virginia, Department of Electrical Engineering, Center for Safety-Critical Systems."
- "Date published: February 2001."
- Paper version no longer available for sale by the Supt. of Docs
- Shipping list no.: 2001-0340-M
- Base of film
- safety base undetermined
- Bibliography note
- Includes bibliographical references (pages 68-73)
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Color
- black and white
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17337871
- Dimensions
- 28 cm.
- Dimensions
- 4x6 in. or 11x15 cm.
- Emulsion on film
- diazo
- Extent
- xi, 75 pages
- Form of item
- microfiche
- Generation
- service copy
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Other physical details
- illustrations
- Positive negative aspect
- negative
- Record ID
- 17337871
- http://bibfra.me/vocab/marc/reductionRatio
- 02
- ReductionRatioRange
- normal reduction
- Reproduction note
- Microfiche.
- Specific material designation
- microfiche
- Stock number
- 052-028-00091-1
Context
Context of Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. JohnsonItem
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/resource/5aosHVvjbB0/" typeof="Book http://bibfra.me/vocab/lite/Instance"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/resource/5aosHVvjbB0/">Embedded digital system reliability and safety analyses, prepared by L.M. Kaufman, B.W. Johnson</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
