Coverart for item
The Resource The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon, Sheng S. Li : Electronic Technology Division

The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon, Sheng S. Li : Electronic Technology Division

Label
The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
Title
The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
Statement of responsibility
Sheng S. Li : Electronic Technology Division
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
DLC
http://library.link/vocab/creatorDate
1938-
http://library.link/vocab/creatorName
Li, Sheng S.
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Institute for Applied Technology (U.S.)
  • United States
Series statement
NBS special publication
Series volume
400-33
http://library.link/vocab/subjectName
  • Silicon
  • Semiconductor doping
  • Electron mobility
  • Electric resistance
Label
The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon, Sheng S. Li : Electronic Technology Division
Instantiates
Publication
Note
  • CODEN: XNBSAV
  • Seimconductor measurement technology
  • Jointly supported by Defense Advanced Research Projects Agency and National Bureau of Standards
Bibliography note
Bibliography: pages 27-28
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16947414
Dimensions
26 cm.
Extent
vii, 28 pages, 1 unnumbered page
Lccn
76608381
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
graphs
Label
The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon, Sheng S. Li : Electronic Technology Division
Publication
Note
  • CODEN: XNBSAV
  • Seimconductor measurement technology
  • Jointly supported by Defense Advanced Research Projects Agency and National Bureau of Standards
Bibliography note
Bibliography: pages 27-28
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16947414
Dimensions
26 cm.
Extent
vii, 28 pages, 1 unnumbered page
Lccn
76608381
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
graphs

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