The Resource Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report
Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report
Resource Information
The item Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Indiana State Library.This item is available to borrow from 1 library branch.
Resource Information
The item Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Indiana State Library.
This item is available to borrow from 1 library branch.
- Language
- eng
- Extent
- 1 volume
- Note
-
- "Union Carbide Corporation, Electronics Division, Components Department."
- "July, 1982."
- "Contract number NAS 8-33957."
- "N84-29088"--Microfiche header
- Label
- Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report
- Title
- Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications
- Title remainder
- final report
- Language
- eng
- Cataloging source
- GPO
- Government publication
- federal national government publication
- Illustrations
- illustrations
- Index
- no index present
- Literary form
- non fiction
- Nature of contents
- bibliography
- http://library.link/vocab/relatedWorkOrContributorName
-
- United States
- Union Carbide Corporation
- Series statement
- NASA-CR
- Series volume
- 162071
- http://library.link/vocab/subjectName
-
- Dielectric films
- Capacitors
- Label
- Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report
- Note
-
- "Union Carbide Corporation, Electronics Division, Components Department."
- "July, 1982."
- "Contract number NAS 8-33957."
- "N84-29088"--Microfiche header
- Bibliography note
- Includes bibliographical references
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17099575
- Dimensions
- 28 cm.
- Extent
- 1 volume
- Form of item
- microfiche
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Other physical details
- illustrations
- Reproduction note
- Microfiche.
- Label
- Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report
- Note
-
- "Union Carbide Corporation, Electronics Division, Components Department."
- "July, 1982."
- "Contract number NAS 8-33957."
- "N84-29088"--Microfiche header
- Bibliography note
- Includes bibliographical references
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17099575
- Dimensions
- 28 cm.
- Extent
- 1 volume
- Form of item
- microfiche
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Other physical details
- illustrations
- Reproduction note
- Microfiche.
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/portal/Testing-and-failure-analysis-to-improve-screening/nglGax4tUD0/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/portal/Testing-and-failure-analysis-to-improve-screening/nglGax4tUD0/">Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
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Data Citation of the Item Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/portal/Testing-and-failure-analysis-to-improve-screening/nglGax4tUD0/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/portal/Testing-and-failure-analysis-to-improve-screening/nglGax4tUD0/">Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications : final report</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
