The Resource Tamped impulse simulation with an electrically exploded etched copper mesh, Michael J. Forrestal, Mathias J. Sagartz, William K. Tucker, Simulation Technology Department, Sandia Laboratories

Tamped impulse simulation with an electrically exploded etched copper mesh, Michael J. Forrestal, Mathias J. Sagartz, William K. Tucker, Simulation Technology Department, Sandia Laboratories

Label
Tamped impulse simulation with an electrically exploded etched copper mesh
Title
Tamped impulse simulation with an electrically exploded etched copper mesh
Statement of responsibility
Michael J. Forrestal, Mathias J. Sagartz, William K. Tucker, Simulation Technology Department, Sandia Laboratories
Creator
Contributor
Author
Subject
Language
eng
Cataloging source
GPO
http://library.link/vocab/creatorName
Forrestal, Michael J
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Sagartz, Mathias J.
  • Tucker, William K.
  • United States
  • Air Force Weapons Laboratory
  • Sandia Laboratories
  • Sandia Laboratories
Series statement
SAND ; 79-0132
http://library.link/vocab/subjectName
Nuclear explosions
Label
Tamped impulse simulation with an electrically exploded etched copper mesh, Michael J. Forrestal, Mathias J. Sagartz, William K. Tucker, Simulation Technology Department, Sandia Laboratories
Instantiates
Publication
Note
  • Prepared by Sandia Laboratories for the United States Department of Energy under contract AT(29-1)-789
  • Prepared for the Environment and Effects Branch, Applied Physics Division, Air Force Weapons Laboratory. Work sponsored by the Defense Nuclear Agency under Subtask code N99QAXAX888 and Work Unit #7
  • Feb. 1979
Bibliography note
Includes bibliographical references
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16995669
Dimensions
28 cm.
Extent
20 pages
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations
Label
Tamped impulse simulation with an electrically exploded etched copper mesh, Michael J. Forrestal, Mathias J. Sagartz, William K. Tucker, Simulation Technology Department, Sandia Laboratories
Publication
Note
  • Prepared by Sandia Laboratories for the United States Department of Energy under contract AT(29-1)-789
  • Prepared for the Environment and Effects Branch, Applied Physics Division, Air Force Weapons Laboratory. Work sponsored by the Defense Nuclear Agency under Subtask code N99QAXAX888 and Work Unit #7
  • Feb. 1979
Bibliography note
Includes bibliographical references
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16995669
Dimensions
28 cm.
Extent
20 pages
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations

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