Coverart for item
The Resource Microelectronic test pattern NBS-4, W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology

Microelectronic test pattern NBS-4, W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology

Label
Microelectronic test pattern NBS-4
Title
Microelectronic test pattern NBS-4
Statement of responsibility
W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology
Creator
Contributor
Author
Subject
Language
eng
Member of
Cataloging source
DLC
http://library.link/vocab/creatorName
Thurber, W. Robert
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Buehler, Martin G.
  • Institute for Applied Technology (U.S.)
  • United States
  • United States
Series statement
  • Semiconductor measurement technology
  • NBS special publication
Series volume
400-32
http://library.link/vocab/subjectName
  • Microelectronics
  • Silicon
Label
Microelectronic test pattern NBS-4, W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology
Instantiates
Publication
Note
  • Activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards
  • Prepared by Electronic Technology Division Institute for Applied Technology
  • Issued April 1978
Bibliography note
Includes bibliographical references
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16968094
Dimensions
26 cm.
Extent
79 pages, 1 unnumbered page
Lccn
78606190
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations
Label
Microelectronic test pattern NBS-4, W. Robert Thurber and Martin G. Buehler ; Electronic Technology Division, Institute for Applied Technology
Publication
Note
  • Activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards
  • Prepared by Electronic Technology Division Institute for Applied Technology
  • Issued April 1978
Bibliography note
Includes bibliographical references
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16968094
Dimensions
26 cm.
Extent
79 pages, 1 unnumbered page
Lccn
78606190
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations

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