The Resource Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
Resource Information
The item Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Indiana State Library.This item is available to borrow from 1 library branch.
Resource Information
The item Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Indiana State Library.
This item is available to borrow from 1 library branch.
- Language
- eng
- Extent
- 1 volume.
- Note
-
- Title from prelim. p. [1]
- Distributed to depository libraries in microfiche; shipping list no. not available
- "Date: November 13, 1985; filing date: 11/27/85"--Awards abstract p. [1]
- Inventors: John A. Zoutendyk; contractor: Jet Propulsion Laboratory
- Label
- Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
- Title
- Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
- Language
- eng
- Cataloging source
- GPO
- Government publication
- federal national government publication
- Illustrations
- illustrations
- Index
- no index present
- Literary form
- non fiction
- http://library.link/vocab/relatedWorkOrContributorName
-
- Jet Propulsion Laboratory (U.S.)
- United States
- Series statement
- NASA case
- Series volume
- NPO-16584-1-CU
- http://library.link/vocab/subjectName
-
- Semiconductors
- Electric fields
- Label
- Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
- Note
-
- Title from prelim. p. [1]
- Distributed to depository libraries in microfiche; shipping list no. not available
- "Date: November 13, 1985; filing date: 11/27/85"--Awards abstract p. [1]
- Inventors: John A. Zoutendyk; contractor: Jet Propulsion Laboratory
- Base of film
- safety base undetermined
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Color
- black and white
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17377849
- Dimensions
- 4x6 in. or 11x15 cm.
- Emulsion on film
- diazo
- Extent
- 1 volume.
- Form of item
- microfiche
- Generation
- service copy
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Positive negative aspect
- negative
- http://bibfra.me/vocab/marc/reductionRatio
- 02
- ReductionRatioRange
- normal reduction
- Reproduction note
- Microfiche.
- Specific material designation
- microfiche
- Stock number
- N 86-25269
- Label
- Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions
- Note
-
- Title from prelim. p. [1]
- Distributed to depository libraries in microfiche; shipping list no. not available
- "Date: November 13, 1985; filing date: 11/27/85"--Awards abstract p. [1]
- Inventors: John A. Zoutendyk; contractor: Jet Propulsion Laboratory
- Base of film
- safety base undetermined
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Color
- black and white
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17377849
- Dimensions
- 4x6 in. or 11x15 cm.
- Emulsion on film
- diazo
- Extent
- 1 volume.
- Form of item
- microfiche
- Generation
- service copy
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Positive negative aspect
- negative
- http://bibfra.me/vocab/marc/reductionRatio
- 02
- ReductionRatioRange
- normal reduction
- Reproduction note
- Microfiche.
- Specific material designation
- microfiche
- Stock number
- N 86-25269
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/portal/Method-of-measuring-field-funneling-and-range/y4hW9FjgRZ4/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/portal/Method-of-measuring-field-funneling-and-range/y4hW9FjgRZ4/">Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/portal/Method-of-measuring-field-funneling-and-range/y4hW9FjgRZ4/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/portal/Method-of-measuring-field-funneling-and-range/y4hW9FjgRZ4/">Method of measuring field funneling and range straggling in semiconductor charge-collecting junctions</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
