The Resource Full field birefringence measurement of grown-in stresses in thin silicon sheet : final technical report 2 January 2002 - 15 January 2008, S. Danyluk, S. Ostapenko

Full field birefringence measurement of grown-in stresses in thin silicon sheet : final technical report 2 January 2002 - 15 January 2008, S. Danyluk, S. Ostapenko

Label
Full field birefringence measurement of grown-in stresses in thin silicon sheet : final technical report 2 January 2002 - 15 January 2008
Title
Full field birefringence measurement of grown-in stresses in thin silicon sheet
Title remainder
final technical report 2 January 2002 - 15 January 2008
Statement of responsibility
S. Danyluk, S. Ostapenko
Creator
Contributor
Subject
Language
eng
Member of
Cataloging source
GPO
http://library.link/vocab/creatorName
Danyluk, Steven S
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
  • dictionaries
  • technical reports
http://library.link/vocab/relatedWorkOrContributorName
  • Ostapenko, S
  • National Renewable Energy Laboratory (U.S.)
Series statement
Subcontract report
Series volume
NREL/SR-520-44237
http://library.link/vocab/subjectName
  • Photovoltaic cells
  • Solar cells
Label
Full field birefringence measurement of grown-in stresses in thin silicon sheet : final technical report 2 January 2002 - 15 January 2008, S. Danyluk, S. Ostapenko
Link
http://purl.access.gpo.gov/GPO/LPS110434
Instantiates
Publication
Note
  • Title from title screen (viewed on Mar. 19, 2009)
  • "November 2008."
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
17604951
Dimensions
unknown
Extent
23 pages
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
digital, PDF file.
Specific material designation
remote
System details
Mode of access: Internet from the NREL web site. Address as of 3/19/09: http://www.nrel.gov/docs/fy09osti/44237.pdf ; current access available via PURL
Label
Full field birefringence measurement of grown-in stresses in thin silicon sheet : final technical report 2 January 2002 - 15 January 2008, S. Danyluk, S. Ostapenko
Link
http://purl.access.gpo.gov/GPO/LPS110434
Publication
Note
  • Title from title screen (viewed on Mar. 19, 2009)
  • "November 2008."
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
mixed
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
17604951
Dimensions
unknown
Extent
23 pages
Form of item
electronic
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other physical details
digital, PDF file.
Specific material designation
remote
System details
Mode of access: Internet from the NREL web site. Address as of 3/19/09: http://www.nrel.gov/docs/fy09osti/44237.pdf ; current access available via PURL

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