The Resource Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide, George Y. Baaklini and Phillip B. Abel, (microform)

Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide, George Y. Baaklini and Phillip B. Abel, (microform)

Label
Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide
Title
Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide
Statement of responsibility
George Y. Baaklini and Phillip B. Abel
Creator
Contributor
Subject
Language
eng
Cataloging source
GPO
http://library.link/vocab/creatorName
Baaklini, George Y
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Abel, Phillip Benjamin
  • United States
Series statement
NASA technical memorandum
Series volume
100177
http://library.link/vocab/subjectName
  • Quality assurance
  • Nondestructive testing
Label
Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide, George Y. Baaklini and Phillip B. Abel, (microform)
Instantiates
Publication
Note
Distributed to depository libraries in microfiche
Control code
17232226
Extent
1 v.
Form of item
microfiche
Reproduction note
Microfiche.
Label
Flaw imaging and ultrasonic techniques for characterizing sintered silicon carbide, George Y. Baaklini and Phillip B. Abel, (microform)
Publication
Note
Distributed to depository libraries in microfiche
Control code
17232226
Extent
1 v.
Form of item
microfiche
Reproduction note
Microfiche.

Library Locations

    • Indiana State LibraryBorrow it
      315 W. Ohio St., Indianapolis, IN, 46202, US
      39.77004 -86.164015

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