The Resource Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno
Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno
Resource Information
The item Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Indiana State Library.This item is available to borrow from 1 library branch.
Resource Information
The item Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Indiana State Library.
This item is available to borrow from 1 library branch.
- Language
- eng
- Extent
- 1 volume.
- Note
- Distributed to depository libraries in microfiche
- Label
- Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide
- Title
- Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide
- Statement of responsibility
- Y. Harada, N. Kurata, G. Furuno
- Language
- eng
- Cataloging source
- GPO
- http://library.link/vocab/creatorName
- Harada, Y
- Government publication
- federal national government publication
- Index
- no index present
- Literary form
- non fiction
- http://library.link/vocab/relatedWorkOrContributorName
-
- Kurata, N
- Furuno, G
- United States
- Series statement
- NASA technical translation
- Series volume
- NASA TT-20332
- http://library.link/vocab/subjectName
-
- Silicon carbide
- Atomic emission spectroscopy
- Decomposition (Chemistry)
- Label
- Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno
- Note
- Distributed to depository libraries in microfiche
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17282345
- Extent
- 1 volume.
- Form of item
- microfiche
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Reproduction note
- Microfiche.
- Stock number
- N 88-29003
- Label
- Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno
- Note
- Distributed to depository libraries in microfiche
- Carrier category
- microfiche
- Carrier category code
- he
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
- txt
- Content type MARC source
- rdacontent
- Control code
- 17282345
- Extent
- 1 volume.
- Form of item
- microfiche
- Media category
- microform
- Media MARC source
- rdamedia
- Media type code
- h
- Reproduction note
- Microfiche.
- Stock number
- N 88-29003
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/portal/Determination-of-impurities-in-silicon-carbide-by/pmBk4o5g_ww/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/portal/Determination-of-impurities-in-silicon-carbide-by/pmBk4o5g_ww/">Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.library.in.gov/portal/Determination-of-impurities-in-silicon-carbide-by/pmBk4o5g_ww/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.library.in.gov/portal/Determination-of-impurities-in-silicon-carbide-by/pmBk4o5g_ww/">Determination of impurities in silicon carbide by CTP AES (inductively coupled plasma atmomic emission spectrometry) after coprecipitation with Lanthanum hydroxide, Y. Harada, N. Kurata, G. Furuno</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.library.in.gov/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.library.in.gov/">Indiana State Library</a></span></span></span></span></div>
