Coverart for item
The Resource ARPA/NBS workshop III : test patterns for integrated circuits, Harry A. Schafft, editor ; Electronic Technology Division

ARPA/NBS workshop III : test patterns for integrated circuits, Harry A. Schafft, editor ; Electronic Technology Division

Label
ARPA/NBS workshop III : test patterns for integrated circuits
Title
ARPA/NBS workshop III
Title remainder
test patterns for integrated circuits
Statement of responsibility
Harry A. Schafft, editor ; Electronic Technology Division
Contributor
Editor
Subject
Genre
Language
eng
Member of
Cataloging source
DLC
Government publication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/relatedWorkOrContributorName
  • Schafft, Harry A.
  • Institute for Applied Technology (U.S.)
  • United States
Series statement
  • Semiconductor measurement technology
  • NBS special publication
Series volume
400-15
http://library.link/vocab/subjectName
  • Integrated circuits
  • Electronic industries
  • Automatic data collection systems
Label
ARPA/NBS workshop III : test patterns for integrated circuits, Harry A. Schafft, editor ; Electronic Technology Division
Instantiates
Publication
Note
  • CODEN: XNBSAV
  • "This activity was supported by the Defense Advanced Research Projects Agency under ARPA order 2397, Program code 5D10, and the National Bureau of Standards."
  • Contains synopses of talks and discussions periods, and describes the results of the third workshop in the ARPA/NBS series."
Bibliography note
Bibliography: page 46
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16935971
Dimensions
26 cm.
Extent
v, 46. 1 unnumbered page
Lccn
75619388
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations
Label
ARPA/NBS workshop III : test patterns for integrated circuits, Harry A. Schafft, editor ; Electronic Technology Division
Publication
Note
  • CODEN: XNBSAV
  • "This activity was supported by the Defense Advanced Research Projects Agency under ARPA order 2397, Program code 5D10, and the National Bureau of Standards."
  • Contains synopses of talks and discussions periods, and describes the results of the third workshop in the ARPA/NBS series."
Bibliography note
Bibliography: page 46
Carrier category
volume
Carrier category code
nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
16935971
Dimensions
26 cm.
Extent
v, 46. 1 unnumbered page
Lccn
75619388
Media category
unmediated
Media MARC source
rdamedia
Media type code
n
Other physical details
illustrations

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