The Resource A study of charged particles/radiation damage to VLSI device materials : final report

A study of charged particles/radiation damage to VLSI device materials : final report

Label
A study of charged particles/radiation damage to VLSI device materials : final report
Title
A study of charged particles/radiation damage to VLSI device materials
Title remainder
final report
Contributor
Subject
Language
eng
Related
Member of
Cataloging source
GPO
Government publication
federal national government publication
Index
no index present
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
United States
Series statement
NASA-CR
Series volume
172036
http://library.link/vocab/subjectName
Electronics
Label
A study of charged particles/radiation damage to VLSI device materials : final report
Instantiates
Publication
Note
Distributed to depository libraries in microfiche
Carrier category
microfiche
Carrier category code
he
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
17254478
Extent
1 volume.
Form of item
microfiche
Media category
microform
Media MARC source
rdamedia
Media type code
h
Reproduction note
Microfiche.
Stock number
N 88-13518
Label
A study of charged particles/radiation damage to VLSI device materials : final report
Publication
Note
Distributed to depository libraries in microfiche
Carrier category
microfiche
Carrier category code
he
Carrier MARC source
rdacarrier
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Control code
17254478
Extent
1 volume.
Form of item
microfiche
Media category
microform
Media MARC source
rdamedia
Media type code
h
Reproduction note
Microfiche.
Stock number
N 88-13518

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      39.77004 -86.164015

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